Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy
نویسندگان
چکیده
منابع مشابه
Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy
Nanocomposites physical properties unexplainable by general mixture laws are usually supposed to be related to interphases, highly present at the nanoscale. The intrinsic dielectric constant of the interphase and its volume need to be considered in the prediction of the effective permittivity of nanodielectrics, for example. The electrostatic force microscope (EFM) constitutes a promising techn...
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Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...
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In order to measure the dielectric permittivity of thin insulting layers, we developed a method based on electrostatic force microscopy (EFM) experiments coupled with numerical simulations. This method allows to characterize the dielectric properties of materials without any restrictions of film thickness, tip radius and tip-sample distance. The EFM experiments consist in the detection of the e...
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ژورنال
عنوان ژورنال: Scanning
سال: 2017
ISSN: 0161-0457,1932-8745
DOI: 10.1155/2017/4198519